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Reliability Testing

Reliability testing ensures that semiconductor devices and other products can perform consistently under real-world and extreme conditions throughout their expected lifespan. These tests expose products to stress factors such as temperature, humidity, voltage, and mechanical impact to detect early failures and validate long-term durability, stability, and quality.

Trio-Tech offers a full suite of reliability testing services, conducted in ISO-certified laboratories to meet stringent international standards:

Testing Capabilities Include:
  • Highly Accelerated Stress Test (HAST – Biased / Unbiased, PCT)
  • Autoclave Test
  • Temperature Stress Screening (ESS / TCC)
  • Thermal Shock (Air-to-Air / Liquid-to-Liquid)
  • High / Low Temperature Tests (ELFR, HTOL, LTOL, HTS, LTS)
  • Climatic Tests (THB, Moisture Resistance)
  • Device Preconditioning, SAT, SEM Inspection, and Shear Test
  • Vibration, Mechanical Shock, and Drop Testing
  • Centrifuge Testing
  • Gross Leak Pressurization & Bubble Testing
  • Additional partner lab services: ESD Latch-up, PCB Electromigration & CAF Testing, Corrosion Analysis, and more